DEFECT CHARACTERIZATION IN CEO2-X AT ELEVATED-TEMPERATURES .1. X-RAY-DIFFRACTION

被引：44

作者：

FABER, J

SEITZ, MA

MUELLER, MH

机构：

[1] MARQUETTE UNIV,DEPT MAT SCI,MILWAUKEE,WI 53233

[2] ARGONNE NATL LAB,ARGONNE,IL 60439

来源：

关键词：

D O I：

10.1016/0022-3697(76)90029-9

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：903 / 907

页数：5

共 34 条

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