DEFECT STRUCTURE OF LASER DEPOSITED Y-BA-CU-O THIN-FILMS ON SINGLE-CRYSTAL MGO SUBSTRATE

被引：58

作者：

RAMESH, R

HWANG, DM

BARNER, JB

NAZAR, L

RAVI, TS

INAM, A

DUTTA, B

WU, XD

VENKATESAN, T

机构：

[1] Bellcore, Red Bank

来源：

JOURNAL OF MATERIALS RESEARCH | 1990年 / 5卷 / 04期

关键词：

D O I：

10.1557/JMR.1990.0704

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structural defects in thin films of nominal composition YBa2Cu3O7 (123) grown on single crystal MgO have been characterized. The main types of stacking defects correspond to the cationic stoichiometries of “248”, “247”, and “224”. Several types of edge dislocations have been observed. Due to the frequent changes in the stacking sequence, antiphase boundaries are created to accommodate the misfit across regions in which the repeat sequence is not identical. The films exhibit a mosaic microstructure due to the formation of grain boundaries in the a-b plane. © 1990, Materials Research Society. All rights reserved.

引用

页码：704 / 716

页数：13

共 21 条

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