ELECTRONIC-STRUCTURE AND IDENTIFICATION OF DEEP DEFECTS IN GAP

被引：41

作者：

SCHEFFLER, M ^{[1
]}

BERNHOLC, J ^{[1
]}

LIPARI, NO ^{[1
]}

PANTELIDES, ST ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1984年 / 29卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.29.3269

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3269 / 3282

页数：14

共 50 条

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