STRUCTURAL STUDIES OF CD0.95ZN0.05 TE AND CD0.90MN0.10 TE UNDER PRESSURE

被引：15

作者：

QADRI, SB ^{[1
]}

SKELTON, EF ^{[1
]}

WEBB, AW ^{[1
]}

KENNEDY, J ^{[1
]}

机构：

[1] USA NIGHT VIS & ELECTRO OPT LAB,FT BELVOIR,VA 22060

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 04期

关键词：

D O I：

10.1116/1.574009

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1971 / 1973

页数：3

共 11 条

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[2] HIGH-PRESSURE EQUATION OF STATE FOR NACL, KCL, AND CSCL [J].

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[3] ELASTIC-CONSTANTS AND THEIR PRESSURE DEPENDENCES IN CD1-XMNXTE WITH 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.52 AND IN CD0.52ZN0.48TE [J].

MAHESWARANATHAN, P ;

SLADEK, RJ ;

DEBSKA, U .

PHYSICAL REVIEW B, 1985, 31 (08) :5212-5216

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[5]

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[6] EVIDENCE FOR BOND STRENGTHENING IN CD1-XZNXTE(X=0.04) [J].

QADRI, SB ;

SKELTON, EF ;

WEBB, AW ;

KENNEDY, J .

APPLIED PHYSICS LETTERS, 1985, 46 (03) :257-259

[7] EFFECTS INFLUENCING THE STRUCTURAL INTEGRITY OF SEMICONDUCTORS AND THEIR ALLOYS [J].

SHER, A ;

CHEN, AB ;

SPICER, WE ;

SHIH, CK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (01) :105-111

[8]

Skelton E. F., 1984, High Temperatures - High Pressures, V16, P527

[9] IMPROVED SYSTEM FOR ENERGY-DISPERSIVE X-RAY-DIFFRACTION WITH SYNCHROTRON RADIATION [J].

SKELTON, EF ;

QADRI, SB ;

WEBB, AW ;

LEE, CW ;

KIRKLAND, JP .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (04) :403-409

[10]

WOLLEY JC, 1960, J PHYS CHEM SOLIDS, V13, P151

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