DARK AND PHOTOCONDUCTIVITY BEHAVIORS OF AMORPHOUS AND CRYSTALLINE C-60 FILMS

被引：18

作者：

ASAKAWA, T ^{[1
]}

SASAKI, M ^{[1
]}

SHIRAISHI, T ^{[1
]}

KOINUMA, K ^{[1
]}

机构：

[1] TOKAI UNIV,FAC ENGN,DEPT COMMUN,KANAGAWA 25912,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 4A期

关键词：

AMORPHOUS C-60; THIN FILMS; POLYCRYSTALLINE C-60; VACUUM EVAPORATION; IN-SITU ELECTRICAL CONDUCTIVITY MEASUREMENT; DARKCONDUCTIVITY; PHOTOCONDUCTIVITY; PERSISTENT PHOTOCONDUCTIVITY;

D O I：

10.1143/JJAP.34.1958

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Deposition and in-situ electrical conductivity measurement of C-60 thin films were conducted under high-vacuum conditions to evaluate the intrinsic electrical properties of C-60 films without ambiguity due to surface contamination. Amorphous and polycrystalline films were deposited by vacuum evaporation of C-60 powders onto fused silica glass, and cleaved NaCl(100) substrates, respectively, on which Al electrodes were deposited in advance. The film conductivity measured in-situ is highly reproducible and strongly dependent on the crystallinity not only in the absolute values of conductivity and its activation energy, but also in the behaviors under light irradiation and air exposure.

引用

页码：1958 / 1962

页数：5

共 20 条

[1] RESISTIVITY OF SINGLE-CRYSTAL C-60 AND EFFECT OF OXYGEN [J].