COMPARISON OF ELECTRON SOURCES FOR HIGH-RESOLUTION AUGER-SPECTROSCOPY IN AN SEM

被引：14

作者：

CHRISTOU, A ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

关键词：

D O I：

10.1063/1.322579

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5464 / 5466

页数：3

共 14 条

[1] LANTHANUM HEXABORIDE ELECTRON EMITTER
AHMED, H
BROERS, AN
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) : 2185 - &
[2] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION
BISHOP, HE
RIVIERE, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &
[3] BOTTOMS WR, 1972, SCANNING ELECTRON MI, P182
[4] BRANDIS EK, 1971, SEM 1971 1, P505
[5] BROERS AN, 1972, 5TH P INT C EL ION B, P3
[6] Christou A., 1975, Scanning Electron Microscopy 1975, P149
[7] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE
CREWE, AV
WALL, J
WELTER, LM
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &
[8] HAINE ME, 1956, 3RD P INT C EL MICR, P639
[9] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
WALDROP, JR
[J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 315 - +
[10] MACDONALD NC, 1971, SCANNING ELECTRON MI, P89