INFLUENCE OF INTERFACE SCATTERING ON THE RESISTANCE OF POLYCRYSTALLINE AU/PD MULTILAYERED THIN-FILMS

被引:21
作者
DEVRIES, JWC
DENBROEDER, FJA
机构
来源
JOURNAL OF PHYSICS F-METAL PHYSICS | 1988年 / 18卷 / 12期
关键词
D O I
10.1088/0305-4608/18/12/014
中图分类号
O59 [应用物理学];
学科分类号
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页码:2635 / 2647
页数:13
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