X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF THIN AMORPHOUS FILMS OF MOO3/IN2O3 (DEPOSITED BY CO-EVAPORATION)

被引：6

作者：

ANWAR, M ^{[1
]}

KHAN, GA ^{[1
]}

HOGARTH, CA ^{[1
]}

BULPETT, R ^{[1
]}

机构：

[1] BRUNEL UNIV,CTR EXPTL TECH,UXBRIDGE UB8 3PH,MIDDX,ENGLAND

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 08期

关键词：

D O I：

10.1016/0584-8547(89)80076-X

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：785 / 788

页数：4

共 10 条

[1] X-RAY PHOTOELECTRON SPECTROSCOPIC (XPS) INVESTIGATIONS OF ETCHING AND ANNEALING EFFECTS ON THIN-FILMS OF MOO3 [J].

ANWAR, M ;

HOGARTH, CA ;

KHAN, GA ;

BULPETT, R .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (08) :789-793

[2] OPTICAL-PROPERTIES OF AMORPHOUS THIN-FILMS OF MOO3 DEPOSITED BY VACUUM EVAPORATION [J].

ANWAR, M ;

HOGARTH, CA .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 109 (02) :469-478

[3]

ANWAR M, 1988, IN PRESS J MATER SCI

[4]

BAKER AD, 1978, ANAL CHEM, V50, pR328, DOI 10.1021/ac50028a030

[5] STRUCTURE OF INDIUM OXIDE TIN OXIDE TRANSPARENT CONDUCTING FILMS BY ELECTRON-DIFFRACTION AND ELECTRON SPECTROSCOPY [J].

BOSNELL, JR ;

WAGHORNE, R .

THIN SOLID FILMS, 1973, 15 (02) :141-148

[6] ELECTRICAL PROPERTIES OF IN2O3 [J].

DEWIT, JHW .

JOURNAL OF SOLID STATE CHEMISTRY, 1973, 8 (02) :142-149

[7] STRUCTURAL ASPECTS AND DEFECT CHEMISTRY IN IN2O3 [J].

DEWIT, JHW .

JOURNAL OF SOLID STATE CHEMISTRY, 1977, 20 (02) :143-148

[8] X-RAY PHOTOEMISSION SPECTROSCOPY STUDIES OF SN-DOPED INDIUM-OXIDE FILMS [J].

FAN, JCC ;

GOODENOUGH, JB .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3524-3531

[9]

HOGARTH CA, 1968, 1968 P INT C PHYS SE, P1274

[10]

Wagner C.D., 1979, HDB XRAY PHOTOELECTR

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