DISTRIBUTION OF THE MAIN ELECTRON TRAP EL2 IN UNDOPED LEC GAAS

被引:8
作者
HASEGAWA, F
IWATA, N
YAMAMOTO, N
NANNICHI, Y
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1983年 / 22卷 / 08期
关键词
D O I
10.1143/JJAP.22.L502
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:L502 / L504
页数:3
相关论文
共 11 条
[1]   STOICHIOMETRY-CONTROLLED COMPENSATION IN LIQUID ENCAPSULATED CZOCHRALSKI GAAS [J].
HOLMES, DE ;
CHEN, RT ;
ELLIOTT, KR ;
KIRKPATRICK, CG .
APPLIED PHYSICS LETTERS, 1982, 40 (01) :46-48
[2]   DETERMINATION OF HOLE AND ELECTRON TRAPS FROM CAPACITANCE MEASUREMENTS [J].
IKOMA, T ;
JEPPSSON, B .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (07) :1011-1019
[3]  
IKOMA T, 1979, SEISAN KENKYU, V30, P555
[4]  
IWATA N, 1983, JPN J APPL PHYS S, V22, P595
[5]   DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].
LANG, DV .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032
[6]   ELECTRON TRAPS IN BULK AND EPITAXIAL GAAS CRYSTALS [J].
MARTIN, GM ;
MITONNEAU, A ;
MIRCEA, A .
ELECTRONICS LETTERS, 1977, 13 (07) :191-193
[7]  
MARTIN GM, 1981, DEFECTS RAD EFFECTS, P281
[8]   EFFECTS OF STOICHIOMETRY ON THERMAL-STABILITY OF UNDOPED, SEMI-INSULATING GAAS [J].
TA, LB ;
HOBGOOD, HM ;
ROHATGI, A ;
THOMAS, RN .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) :5771-5775
[9]   CHARACTERIZATION OF NONUNIFORMITY IN SEMI-INSULATING LEC GAAS BY PHOTO-LUMINESCENCE SPECTROSCOPY [J].
TAJIMA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (04) :L227-L229
[10]  
TANIGUCHI M, 1982, I PHYS C SER, V65, P65