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FLUX-CREEP DISSIPATION IN EPITAXIAL YBA2CU3O7-DELTA FILM - MAGNETIC-FIELD AND ELECTRICAL-CURRENT DEPENDENCE
被引:63
作者:
KIM, JJ
LEE, HK
CHUNG, JW
SHIN, HJ
LEE, HJ
KU, JK
机构:
[1] RES INST IND SCI & TECHNOL,DIV PHYS,KYUNGBUK 790600,SOUTH KOREA
[2] POHANG INST SCI & TECHNOL,DEPT CHEM,KYUNGBUK 790600,SOUTH KOREA
来源:
PHYSICAL REVIEW B
|
1991年
/
43卷
/
04期
关键词:
D O I:
10.1103/PhysRevB.43.2962
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We have investigated the dissipation characteristics in the mixed state of YBa2Cu3O7-delta film, grown epitaxially on the SrTiO3(100) substrate, in terms of external transport current as well as magnetic field applied parallel to the c axis of the film. The dissipation fits well the thermally activated flux creep model, R = R0 exp(-U/k(B)T), where U is a function of electrical current, magnetic field, and temperature. In the range of current density approximately 20-4000 A/cm2, the current dependence of the activation energy U scales with ln(I/I0), as observed recently by Zeldov et al. U shows a power-law dependence on magnetic field as H-beta with beta = 0.73 +/- 0.002. We obtain the resistance prefactor R0 proportional to the applied magnetic field, provided the Ginzburg-Landau-type magnetic-field suppression of the mean-field transition temperature T(c)0 is taken into account. In addition, we present the magnetoresistance at various temperatures below T(c)0, in good accordance with the flux-creep model.
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页码:2962 / 2967
页数:6
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