RAPID ANNEALING FACTOR FOR BIPOLAR SILICON DEVICES IRRADIATED BY FAST-NEUTRON PULSE

被引:9
作者
MCMURRAY, LR
MESSENGER, GC
机构
关键词
D O I
10.1109/TNS.1981.4335736
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:4392 / 4396
页数:5
相关论文
共 4 条
[1]   MODELING RAPID ANNEALING IN DIGITAL INTEGRATED-CIRCUITS [J].
DUNCAN, LW ;
MALLON, CE .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :4750-4757
[2]   TRANSIENT ANNEALING OF DEFECTS IN IRRADIATED SILICON DEVICES [J].
GREGORY, BL ;
SANDER, HH .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (09) :1328-+
[3]  
SANDER HH, 1971, SCR722703 SAND LAB R
[4]   THEORETICAL AND EXPERIMENTAL DETERMINATIONS OF NEUTRON ENERGY DEPOSITION IN SILICON [J].
SMITH, EC ;
BINDER, D ;
COMPTON, PA ;
WILBUR, RI .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1966, NS13 (06) :11-+