STRUCTURAL STUDY OF HYDROGENATED AMORPHOUS-SILICON CARBON ALLOYS

被引:54
作者
SPROUL, A [1 ]
MCKENZIE, DR [1 ]
COCKAYNE, DJH [1 ]
机构
[1] UNIV SYDNEY,ELECTRON MICROSCOPY UNIT,SYDNEY,NSW 2006,AUSTRALIA
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1986年 / 54卷 / 02期
关键词
D O I
10.1080/13642818608239007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:113 / 131
页数:19
相关论文
共 26 条
[1]  
Brigham E. O., 1974, FAST FOURIER TRANSFO
[2]  
CONTE SD, 1965, ELEMENTARY NUMERICAL
[3]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[4]  
EGERTON RF, 1982, MICROBEAM ANAL
[5]  
FAGEN EA, 1974, AMORPHOUS LIQUID SEM, P601
[6]   INVESTIGATION OF HYDROCARBON-PLASMA-GENERATED CARBON-FILMS BY ELECTRON-ENERGY-LOSS SPECTROSCOPY [J].
FINK, J ;
MULLERHEINZERLING, T ;
PFLUGER, J ;
SCHEERER, B ;
DISCHLER, B ;
KOIDL, P ;
BUBENZER, A ;
SAH, RE .
PHYSICAL REVIEW B, 1984, 30 (08) :4713-4718
[7]  
GRACZYCK JF, 1976, NATO ADV STUDY I S B, V20, P8
[8]   STRUCTURE OF GLOW-DISCHARGE AMORPHOUS SILICON [J].
GRACZYK, JF .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 55 (01) :231-242
[9]   SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (I) [J].
GRACZYK, JF ;
CHAUDHARI, P .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1973, 58 (01) :163-179
[10]  
GRIGOROVICI R, 1973, ELECTRONIC STRUCTURA, P191