DETERMINATION OF DEEP LEVELS IN CU-DOPED GAP USING TRANSIENT-CURRENT SPECTROSCOPY

被引：68

作者：

WESSELS, BW ^{[1
]}

机构：

[1] GE,CORP RES & DEV,SCHENECTADY,NY 12301

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 03期

关键词：

D O I：

10.1063/1.322695

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1131 / 1133

页数：3

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