INSPECTION OF OUT-OF-PLANE SURFACE MOVEMENTS OVER SMALL AREAS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引:9
作者
HERBERT, DP
机构
关键词
D O I
10.1016/0143-8166(83)90016-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:229 / 239
页数:11
相关论文
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[4]  
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[5]   DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .1. WAVELENGTH CHANGE DEPENDENT DE-CORRELATION WITH APPLICATION TO CONTOURING AND SURFACE-ROUGHNESS MEASUREMENT [J].
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