COMPREHENSIVE MODEL FOR PREDICTING SEMICONDUCTOR DETECTOR PERFORMANCE

被引：13

作者：

SWIERKOWSKI, SP ^{[1
]}

机构：

[1] UNIV CALIF, LAWRENCE LIVERMORE LAB, LIVERMORE, CA 94550 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1976年 / 23卷 / 01期

关键词：

D O I：

10.1109/TNS.1976.4328227

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：131 / 137

页数：7

共 10 条

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