MEASUREMENT OF STATISTICS OF SECONDARY ELECTRON EMISSION

被引：21

作者：

DELANEY, CFG

WALTON, PW

机构：

来源：

关键词：

D O I：

10.1109/TNS.1966.4324040

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：742 / +

页数：1

共 12 条

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[5] UNTERSUCHUNGEN ZUR MEHRFACH-EMISSION VON SEKUNDARELEKTRONEN
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[6] SECONDARY EMISSION STATISTICS THEIR APPLICATION TO WINDOWLESS MULTIPLIERS
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JEHANNO, C
DUCROS, R
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1964, NS11 (03) : 169 - +
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[8] PAUL W, 1955, BETAGAMMARAY SPECTRO, P7
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