SURFACE AND THIN-FILM COMPOSITIONAL ANALYSIS - DESCRIPTION AND COMPARISON OF TECHNIQUES

被引：40

作者：

EVANS, CA

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

[2] UNIV ILLINOIS,SCH CHEM SCI,URBANA,IL 61801

来源：

ANALYTICAL CHEMISTRY | 1975年 / 47卷 / 09期

关键词：

D O I：

10.1021/ac60359a026

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：A818 / &

共 36 条

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[3] HIGH MASS RESOLUTION ION MICROPROBE MASS-SPECTROMETRY OF COMPLEX MATRICES [J].

BAKALE, DK ;

COLBY, BN ;

EVANS, CA .

ANALYTICAL CHEMISTRY, 1975, 47 (09) :1532-1537

[4] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

BENNINGHOVEN, A .

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[5]

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[6]

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[7]

BRAGG WH, 1905, PHILOS MAG, V10, pS318

[8]

Carter G., 1968, ION BOMBARDMENT SOLI

[9]

CHANG CC, 1974, CHARACTERIZATION SOL

[10]

Coburn J. W., 1974, Critical Reviews in Solid State Sciences, V4, P561, DOI 10.1080/10408437308245843

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