CHARGE-COUPLED DEVICE ADVANCES FOR X-RAY SCIENTIFIC APPLICATIONS IN 1986

被引:10
作者
JANESICK, JR [1 ]
ELLIOTT, T [1 ]
COLLINS, S [1 ]
DAUD, T [1 ]
CAMPBELL, D [1 ]
GARMIRE, G [1 ]
机构
[1] PENN STATE UNIV, UNIVERSITY PK, PA 16802 USA
关键词
Astronomy; -; Spectroscopy; X-ray;
D O I
10.1117/12.7974042
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A theoretical model is presented that predicts the output response of a thinned CCD to soft x-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for variety of CCD structures, and conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an Advanced X-ray Astrophysics Facility (AXAF) instrument. We compare the results of the analysis to existing state-of-the-art CCDs and project improvements that will be made in the near future.
引用
收藏
页码:156 / 166
页数:11
相关论文
共 12 条
[1]   800X800 CHARGE-COUPLED DEVICE IMAGE SENSOR [J].
BLOUKE, MM ;
JANESICK, JR ;
HALL, JE ;
COWENS, MW ;
MAY, PJ .
OPTICAL ENGINEERING, 1983, 22 (05) :607-614
[2]  
BRESSE J, 1972, SCANNING ELECTRON MI
[3]  
BRODERSEN R, 1975, IEEE T ELECTRON DEVI, V22
[4]  
GARMIRE GP, 1986, P SOC PHOTO-OPT INS, V597, P261
[5]  
Janesick J., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V570, P46
[6]  
Janesick J., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V570, P7
[7]  
JANESICK J, 1986, P SOC PHOTO-OPT INS, V627, P542
[8]   POTENTIAL OF CCDS FOR UV AND X-RAY PLASMA DIAGNOSTICS [J].
JANESICK, JR ;
ELLIOTT, T ;
MARSH, HH ;
COLLINS, S ;
MCCARTHY, JK ;
BLOUKE, MM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (05) :796-801
[9]  
JANESICK JR, 1984, P SOC PHOTO-OPT INST, V501, P2, DOI 10.1117/12.944641
[10]  
JANESICK JR, 1981, P SOC PHOTO-OPT INST, V290, P165