AN ELECTRON TRANSPORT MODEL FOR PREDICTION OF X-RAY PRODUCTION AND ELECTRON BACKSCATTERING IN ELECTRON MICROANALYSIS

被引:56
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BROWN, DB
OGILVIE, RE
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10.1063/1.1708054
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O59 [应用物理学];
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页码:4429 / &
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共 21 条
[1]   PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .2. COMPUTATIONAL METHODS [J].
ARCHARD, GD ;
MULVEY, T .
BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10) :626-&
[2]   BACK SCATTERING OF ELECTRONS [J].
ARCHARD, GD .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) :1505-&
[3]  
ARCHARD GD, 1960, 2ND P S XRAY MICR MI, P331
[4]  
ARCHARD GD, 1964, 3 P INT S XRAY OPT X, P393
[5]  
Bethe H, 1930, ANN PHYS-BERLIN, V5, P325
[6]  
Bethe H. A., 1938, P AM PHILOS SOC, V78, P573
[7]   EVALUATION OF ARCHARD ELECTRON DIFFUSION MODEL [J].
BROWN, DB ;
OGILVIE, RE .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (10) :2793-&
[8]   SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J].
CASTAING, R ;
DESCAMPS, J .
JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04) :304-317
[9]  
Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]
[10]   PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .1. PHYSICAL BASIS [J].
DUNCUMB, P ;
SHIELDS, PK .
BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10) :617-&