ELECTRONIC SPECKLE INTERFEROMETRY, PHASE-MAPPING, AND NONDESTRUCTIVE TESTING TECHNIQUES APPLIED TO REAL-TIME, THERMAL LOADING

被引：17

作者：

WANG, JM ^{[1
]}

GRANT, I ^{[1
]}

机构：

[1] FLUID LOADING & INSTRUMENTAT CTR,EDINBURGH EH14 4AS,MIDLOTHIAN,SCOTLAND

来源：

APPLIED OPTICS | 1995年 / 34卷 / 19期

关键词：

D O I：

10.1364/AO.34.003620

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A digital phase-mapping method has been developed for application in real-time electronic speckle interferometry studies. Its principles and application to a continuously deforming object are described. An efficient digital image-processing algorithm has been developed that permits quantitative interpretation of the resulting phase maps.

引用

页码：3620 / 3627

页数：8

共 13 条

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