THE IDENTIFICATION OF FRINGE POSITIONS IN SPECKLE PATTERNS

[1] [Anonymous], 1983, HOLOGRAPHIC SPECKLE

[2] BIRCH KG, 1983, P SOC PHOTO-OPT INST, V369, P186, DOI 10.1117/12.934367

[3] DOUBLE EXPOSURE TECHNIQUE FOR SPECKLE PATTERN INTERFEROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (04): : 277 - +

[4] IMAGE-PROCESSING APPLIED TO THE INTERACTIVE ANALYSIS OF INTERFEROMETRIC FRINGES [J]. APPLIED OPTICS, 1981, 20 (18): : 3245 - 3250

[5] DETERMINATION OF LOCAL MASS-TRANSFER COEFFICIENTS BY HOLOGRAPHIC INTERFEROMETRY .1. GENERAL PRINCIPLES - APPLICATION AND VERIFICATION FOR MASS-TRANSFER MEASUREMENTS AT A FLAT PLATE EXPOSED TO A LAMINAR ROUND AIR-JET [J]. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 1974, 17 (10) : 1151 - 1162

[6] ONLINE ACQUISITION AND ANALYSIS FOR HOLOGRAPHIC NON-DESTRUCTIVE EVALUATION [J]. OPTICAL ENGINEERING, 1982, 21 (06) : 1016 - 1021

[7] COHERENT OPTICAL MEASUREMENT TECHNIQUES IN PROFILOMETRIC DETERMINATION OF LOCAL MASS-TRANSFER COEFFICIENTS [J]. OPTICS AND LASERS IN ENGINEERING, 1984, 5 (04) : 211 - 229

[8] AUTOMATIC FRINGE ANALYSIS WITH A COMPUTER IMAGE-PROCESSING SYSTEM [J]. APPLIED OPTICS, 1983, 22 (14) : 2169 - 2176

[9] SCHEMM JB, 1983, APPL OPT, V20, P2850

[10] COMPUTER-ANALYSIS OF HOLOGRAPHIC INTERFEROGRAMS FOR NONDESTRUCTIVE TESTING [J]. OPTICAL ENGINEERING, 1979, 18 (05) : 469 - 472

[1] [Anonymous], 1983, HOLOGRAPHIC SPECKLE

[2] BIRCH KG, 1983, P SOC PHOTO-OPT INST, V369, P186, DOI 10.1117/12.934367

[3] DOUBLE EXPOSURE TECHNIQUE FOR SPECKLE PATTERN INTERFEROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (04): : 277 - +

[4] IMAGE-PROCESSING APPLIED TO THE INTERACTIVE ANALYSIS OF INTERFEROMETRIC FRINGES [J]. APPLIED OPTICS, 1981, 20 (18): : 3245 - 3250

[5] DETERMINATION OF LOCAL MASS-TRANSFER COEFFICIENTS BY HOLOGRAPHIC INTERFEROMETRY .1. GENERAL PRINCIPLES - APPLICATION AND VERIFICATION FOR MASS-TRANSFER MEASUREMENTS AT A FLAT PLATE EXPOSED TO A LAMINAR ROUND AIR-JET [J]. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 1974, 17 (10) : 1151 - 1162

[6] ONLINE ACQUISITION AND ANALYSIS FOR HOLOGRAPHIC NON-DESTRUCTIVE EVALUATION [J]. OPTICAL ENGINEERING, 1982, 21 (06) : 1016 - 1021

[7] COHERENT OPTICAL MEASUREMENT TECHNIQUES IN PROFILOMETRIC DETERMINATION OF LOCAL MASS-TRANSFER COEFFICIENTS [J]. OPTICS AND LASERS IN ENGINEERING, 1984, 5 (04) : 211 - 229

[8] AUTOMATIC FRINGE ANALYSIS WITH A COMPUTER IMAGE-PROCESSING SYSTEM [J]. APPLIED OPTICS, 1983, 22 (14) : 2169 - 2176

[9] SCHEMM JB, 1983, APPL OPT, V20, P2850

[10] COMPUTER-ANALYSIS OF HOLOGRAPHIC INTERFEROGRAMS FOR NONDESTRUCTIVE TESTING [J]. OPTICAL ENGINEERING, 1979, 18 (05) : 469 - 472