INSTRUMENTAL EFFECTS IN ELECTRON LOSS SPECTRA FROM SURFACES DUE TO USE OF LEED OPTICS

被引:4
作者
AVERY, NR [1 ]
机构
[1] UNIV MELBOURNE,CSIRO,DIV TRIBOPHYS,PARKVILLE 3052,VICTORIA,AUSTRALIA
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 08期
关键词
D O I
10.1088/0022-3735/9/8/021
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:676 / 679
页数:4
相关论文
共 7 条
[1]  
COSSLETT VE, 1946, INTRO ELECTRON OPTIC
[2]  
HUCHITAL DA, 1972, ELECTRON SPECTROSCOP, P79
[3]   OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMS [J].
PALMBERG, PW .
APPLIED PHYSICS LETTERS, 1968, 13 (05) :183-&
[4]   INELASTIC SCATTERING OF LOW ENERGY ELECTRONS FROM SURFACES [J].
SCHEIBNER, EJ ;
THARP, LN .
SURFACE SCIENCE, 1967, 8 (1-2) :247-+
[5]   DESIGN OF RETARDING FIELD ENERGY ANALYZERS [J].
SIMPSON, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (12) :1283-&
[6]   RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J].
TAYLOR, NJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :792-&
[7]   INSTRUMENTAL EFFECTS OF RETARDING GRIDS IN A LEED APPARATUS [J].
WEI, PSP ;
CHO, AY ;
CALDWELL, CW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (08) :1075-&