INVESTIGATION OF A SILICON SINGLE-CRYSTAL BY MEANS OF THE DIFFRACTION OF MOSSBAUER RADIATION

被引：14

作者：

KREC, K

STEINER, W

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷 / JUL期

关键词：

D O I：

10.1107/S0108767384000891

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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页码：459 / 465

页数：7

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