A TIME-OF-FLIGHT SPECTROMETER FOR MEDIUM ENERGY ION-SCATTERING

被引：21

作者：

MENDENHALL, MH ^{[1
]}

WELLER, RA ^{[1
]}

机构：

[1] VANDERBILT UNIV,CTR ATOM & MOLEC PHYS SURFACES,DEPT MAT SCI & ENGN,NASHVILLE,TN 37235

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 40-1卷

关键词：

D O I：

10.1016/0168-583X(89)90628-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1239 / 1243

页数：5

共 16 条

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 13 (1-3) :207-212

[5] TIME OF FLIGHT SPECTROMETRY IN HEAVY-ION BACKSCATTERING ANALYSIS [J].

CHEVARIER, A ;

CHEVARIER, N .

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[6]

Chu W.-K., 1978, BACKSCATTERING SPECT

[7]

FEUERSTEIN A, 1976, ION BEAM SURFACE LAY, P471

[8] HIGH-RESOLUTION SPECTROMETRY FOR RELATIVISTIC HEAVY-IONS [J].

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[9]

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[10] RUTHERFORD BACKSCATTERING ANALYSIS OF GAAS-OXIDE INTERFACE [J].

PERSON, P ;

CHEVARIER, A ;

CHEVARIER, N ;

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LAMOUCHE, D ;

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STERN, M .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) :425-430

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