HEAVY-ION RUTHERFORD BACKSCATTERING ANALYSIS USED TO STUDY THE ALLOYED METAL GAAS INTERFACE

被引：9

作者：

CHEVARIER, A

CHEVARIER, N

STERN, M

LAMOUCHE, D

CLECHET, P

MARTIN, JR

PERSON, P

机构：

[1] UNIV LYON 1,INST NATL PHYS NUCL & PHYS PARTICULES,F-69622 VILLEURBANNE,FRANCE

[2] ECOLE CENT LYON,PHYS CHIM INTERFACES LAB,F-69130 ECULLY,FRANCE

来源：

关键词：

D O I：

10.1016/0168-583X(86)90504-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：207 / 212

页数：6

共 9 条

[1] TIME OF FLIGHT SPECTROMETRY IN HEAVY-ION BACKSCATTERING ANALYSIS
CHEVARIER, A
CHEVARIER, N
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 1 - 5
[2] ELECTROLESS GOLD PLATING ON III-V COMPOUND-CRYSTALS
DASARO, LA
NAKAHARA, S
OKINAKA, Y
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (09) : 1935 - 1940
[3] ALLOYING BEHAVIOR OF AU AND AU-GE ON GAAS
GYULAI, J
MAYER, JW
RODRIGUEZ, V
YU, AYC
GOPEN, HJ
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) : 3578 - +
[4] LAMOUCHE D, 1984, THESIS LYON
[5] LAMOUCHE D, UNPUB THIN SOLID FIL
[6] RUTHERFORD BACKSCATTERING ANALYSIS OF ELECTROLESS GOLD CONTACTS ON CADMIUM TELLURIDE
MANCINI, AM
QUIRINI, A
VASANELLI, L
PERILLO, E
ROSATO, E
SPADACCINI, G
BARBARINO, E
[J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (08) : 5785 - 5788
[7] RBS ANALYSIS OF ALXGA1-XAS LAYERS USING 30 MEV O-16 IONS
OSTLING, M
PETERSSON, CS
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 4 (01) : 88 - 91
[8] OXYGEN DISTRIBUTION PROFILES IN THIN EVAPORATED CONTACTS ON SINGLE-CRYSTAL SILICON
PETERSSON, S
NORDE, H
POSSNERT, G
ORRE, B
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 285 - 288
[9] ION-BEAM ANALYSIS TECHNIQUES AND CHARACTERIZATION OF AMORPHOUS HYDROGENATED GAAS
THOMAS, JP
FALLAVIER, M
CARCHANO, H
ALIMOUSSA, L
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 579 - 583