DEVELOPMENT OF NATIONAL BUREAU OF STANDARDS THIN GLASS-FILMS FOR X-RAY-FLUORESCENCE SPECTROMETRY

被引：27

作者：

PELLA, PA ^{[1
]}

NEWBURY, DE ^{[1
]}

STEEL, EB ^{[1
]}

BLACKBURN, DH ^{[1
]}

机构：

[1] NBS,CTR MAT SCI,GAITHERSBURG,MD 20899

来源：

ANALYTICAL CHEMISTRY | 1986年 / 58卷 / 06期

关键词：

D O I：

10.1021/ac00297a034

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1133 / 1137

页数：5

共 16 条

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[3]

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[4] ION-BEAM DEPOSITION OF THIN-FILMS OF FERROELECTRIC LEAD ZIRCONATE TITANATE (PZT) [J].

CASTELLANO, RN ;

FEINSTEIN, LG .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (06) :4406-4411

[5] AN XPS STUDY OF THE ANGULAR-DEPENDENCE OF PREFERENTIAL SPUTTERING AND ION-INDUCED REDUCTION IN LEAD-OXIDE CONTAINING GLASSES [J].

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SUTHERLAND, I ;

WALLS, JM .

VACUUM, 1984, 34 (06) :659-662

[6]

DZUBAY TG, 1977, ADV XRAY ANAL, P411

[7]

GIAUQUE RD, 1976, XRAY FLUORESCENCE ME, pCH11

[8]

OLSON KW, 1978, 29TH P PITTSB C CLEV

[9]

PELLA PA, 1976, EPA600276126 REP

[10]

PELLA PA, 1980, EPA600780123 REP

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