AN XPS STUDY OF THE ANGULAR-DEPENDENCE OF PREFERENTIAL SPUTTERING AND ION-INDUCED REDUCTION IN LEAD-OXIDE CONTAINING GLASSES

被引:11
作者
CHRISTIE, AB
SUTHERLAND, I
WALLS, JM
机构
关键词
D O I
10.1016/0042-207X(84)90058-7
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:659 / 662
页数:4
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共 23 条
[1]   OXIDATION OF POLYCRYSTALLINE AND (111) LEAD SURFACES STUDIED BY ELECTRON-SPECTROSCOPY [J].
CHADWICK, D ;
CHRISTIE, AB .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1980, 76 :267-275
[2]   AN XPS STUDY OF ION-INDUCED COMPOSITIONAL CHANGES WITH GROUP-II AND GROUP-IV COMPOUNDS [J].
CHRISTIE, AB ;
LEE, J ;
SUTHERLAND, I ;
WALLS, JM .
APPLIED SURFACE SCIENCE, 1983, 15 (1-4) :224-237
[3]   AN XPS STUDY OF ION-INDUCED DISSOCIATION ON METAL CARBONATE SURFACES [J].
CHRISTIE, AB ;
SUTHERLAND, I ;
WALLS, JM .
VACUUM, 1981, 31 (10-1) :513-517
[4]  
CHRISTIE AB, 1984, SURFACE SCI
[5]  
CHRISTIE AU, UNPUB
[6]   XPS STUDIES OF ION-BOMBARDMENT DAMAGE OF TRANSITION-METAL SULFIDES [J].
COYLE, GJ ;
TSANG, T ;
ADLER, I ;
YIN, L .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 20 (03) :169-182
[7]   SURFACE-MORPHOLOGY OF SI(100), GAAS(100) AND INP(100) FOLLOWING O-2+ AND CS+ ION-BOMBARDMENT [J].
DUNCAN, S ;
SMITH, R ;
SYKES, DE ;
WALLS, JM .
VACUUM, 1984, 34 (1-2) :145-151
[8]   ELECTRONIC BAND-STRUCTURE AND OPTICAL-PROPERTIES OF OXIDE GLASSES .2. LEAD SILICATES [J].
ELLIS, E ;
JOHNSON, DW ;
BREEZE, A ;
MAGEE, PM ;
PERKINS, PG .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1979, 40 (02) :125-137
[9]  
JOSHI A, 1975, METHODS SURFACE ANAL
[10]  
KELLY R, 1980, P S SPUTTERING, P390