ELECTRICAL-PROPERTIES OF JUNCTIONS BETWEEN SPUTTER DEPOSITED SILICON FILMS AND MONOCRYSTALLINE SILICON

被引:2
作者
KOSHY, J
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 79卷 / 01期
关键词
D O I
10.1002/pssa.2210790144
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:K21 / K24
页数:4
相关论文
共 10 条
[1]   MEASUREMENT OF CONDUCTIVITY DENSITY OF STATES OF EVAPORATED AMORPHOUS SILICON FILMS [J].
BRODSKY, MH ;
DOHLER, GH ;
STEINHARDT, PJ .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 72 (02) :761-770
[2]  
GRIGOROVICI R, 1968, REV ROUM PHYS, V13, P317
[3]  
GRIGOROVICI R, 1965, REV ROUM PHYS, V10, P649
[4]  
GRIGOROVICI R, 1965, REV ROUM PHYS, V10, P641
[5]   HOLE INJECTION IN JUNCTIONS BETWEEN AMORPHOUS GE LAYERS AND N-TYPE GE SINGLE CRYSTALS [J].
GRIGOROVICI, R ;
CROITORU, N ;
VESCAN, L ;
MARINA, M .
PHYSICA STATUS SOLIDI, 1967, 24 (01) :K17-+
[6]  
GRIGOROVICI R, 1968, P C PHYS SEMICOND DU, P423
[7]   OHMIC CONTACTS ON SEMICONDUCTORS USING INDIUM AMALGAM [J].
HILL, R ;
WILSON, S ;
RICHARDSON, D .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (01) :185-+
[8]   MODIFIED FORWARD IV PLOT FOR SCHOTTKY DIODES WITH HIGH SERIES RESISTANCE [J].
NORDE, H .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (07) :5052-5053
[9]   ELECTRICAL-PROPERTIES OF JUNCTIONS BETWEEN GE FILMS AND MONO-CRYSTALLINE SILICON [J].
TOVE, PA ;
ALI, MP ;
IBRAHIM, MM ;
NORDE, H .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02) :491-496
[10]  
YOSHIDA A, 1975, C AMORPHOUS LIQUID S