COMBINED LOW-ANGLE AND HIGH-ANGLE X-RAY STRUCTURAL REFINEMENT OF A CO/PT(111) MULTILAYER EXHIBITING PERPENDICULAR MAGNETIC-ANISOTROPY

被引：3

作者：

ANKNER, JF ^{[1
]}

BORCHERS, JA ^{[1
]}

FARROW, RFC ^{[1
]}

MARKS, RF ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 10期

关键词：

D O I：

10.1063/1.352621

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used Cu Kalpha radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.

引用

页码：6427 / 6429

页数：3

共 20 条

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