DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS BASED ON INVERSE SYNTHESIS

被引：188

作者：

DOBROWOLSKI, JA

HO, FC

WALDORF, A

机构：

来源：

APPLIED OPTICS | 1983年 / 22卷 / 20期

关键词：

D O I：

10.1364/AO.22.003191

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3191 / 3200

页数：10

共 37 条

[1] ABELES F, 1963, PROGR OPTICS, V2, P251
[2] ALLEN TH, 1978, NBS SPEC PUB, V541, P33
[3] Alperovich L. I., 1979, Optics and Spectroscopy, V47, P516
[4] Bennet H.E., 1967, PHYS THIN FILMS, V4, P1
[5] COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS
BENNETT, JM
BOOTY, MJ
[J]. APPLIED OPTICS, 1966, 5 (01): : 41 - &
[6] BERGMANNSCHAEFE, 1974, LEHRBUCH EXPERIMENTA, V3
[7] BOHME H, 1982, OPTIK, V62, P27
[8] ALGEBRAIC-METHOD FOR EXTRACTING THIN-FILM OPTICAL-PARAMETERS FROM SPECTROPHOTOMETER MEASUREMENTS
CASE, WE
[J]. APPLIED OPTICS, 1983, 22 (12): : 1832 - 1836
[9] VERSATILE COMPUTER-PROGRAM FOR ABSORBING OPTICAL THIN-FILM SYSTEMS
DOBROWOLSKI, JA
[J]. APPLIED OPTICS, 1981, 20 (01): : 74 - 81
[10] OPTICAL-CONSTANTS OF INCONEL ALLOY FILMS
GOODELL, WV
COULTER, JK
JOHNSON, PB
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (02) : 185 - 188