DISLOCATION NUCLEATION NEAR THE CRITICAL THICKNESS IN GESI/SI STRAINED LAYERS

被引：135

作者：

EAGLESHAM, DJ ^{[1
]}

KVAM, EP ^{[1
]}

MAHER, DM ^{[1
]}

HUMPHREYS, CJ ^{[1
]}

BEAN, JC ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 05期

关键词：

D O I：

10.1080/01418618908209837

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1059 / 1073

页数：15

共 27 条

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