USE OF EOS (ELECTROLYTE OXIDE SEMICONDUCTOR) SYSTEMS FOR THE ELECTRICAL CHARACTERIZATION OF ILLUMINATED SEMICONDUCTOR DIELECTRIC INTERFACES

被引：1

作者：

DIOT, JL

JOSEPH, J

MARTIN, JR

CLECHET, P

机构：

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1986年 / 197卷 / 1-2期

关键词：

D O I：

10.1016/0022-0728(86)80162-0

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：381 / 385

页数：5

共 11 条

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