SYNCHROTRON-RADIATION AND FREE-ELECTRON LASER-SURFACE AND INTERFACE SPECTROSCOPY AND SPECTROMICROSCOPY

被引:6
作者
MARGARITONDO, G
机构
[1] Institut de Physique Appliquée, Ecole Polytechnique Fédérale
基金
美国国家科学基金会;
关键词
D O I
10.1016/0079-6816(94)90086-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Experimental breakthroughs are having a big impact on surface and interface science. We review two series of results: first, photoemission experiments performed with high (0.1 micron) lateral resolution on the scanning instrument MAXIMUM at Wisconsin. These experiments revealed, in particular, core-level shifts from place to place on cleaved semiconductor surfaces, raising serious questions about a whole class of interface formation experiments. The second series of results applied for the first time a free-electron laser (the world's brightest Vanderbilt University infrared facility) to surface and interface physics. Using the FELIPE (FEL Internal PhotoEmission) technique, we measured heterojunction band discontinuities with a few meV accuracy.
引用
收藏
页码:275 / 293
页数:19
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