MEASUREMENT OF SURFACE FATIGUE DAMAGE BY EXOELECTRON EMISSION

被引:19
作者
BAXTER, WJ [1 ]
机构
[1] GM CORP,RES LABS,PHYS DEPT,WARREN,MI 48090
来源
METALLURGICAL TRANSACTIONS | 1975年 / A 6卷 / 04期
关键词
D O I
10.1007/BF02672295
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:749 / 754
页数:6
相关论文
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[2]   DETECTION OF FATIGUE DAMAGE BY EXOELECTRON EMISSION [J].
BAXTER, WJ .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (02) :608-614
[3]   SLOW-ELECTRON MEAN FREE PATHS IN ALUMINUM, SILVER, AND GOLD [J].
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MINER MA, 1945, J APPL MECH, V12, P159