INVESTIGATION OF ULTRA-THIN AG FILMS ON NI WITH THE PHOTOELECTRON EMISSION MICROSCOPE

被引：21

作者：

BETHGE, H

KRAJEWSKI, T

LICHTENBERGER, O

机构：

来源：

ULTRAMICROSCOPY | 1985年 / 17卷 / 01期

关键词：

D O I：

10.1016/0304-3991(85)90173-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：21 / 30

页数：10

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