EFFECT OF ACCELERATING VOLTAGE AND THICKNESS ON AN EFFECTIVE SIGNAL-TO-NOISE RATIO IN ELECTRON-ENERGY LOSS SPECTROSCOPY

被引：4

作者：

BOTTON, G

LESPERANCE, G

机构：

[1] Département Métallurgie et Génie des Matériaux, Ecole Polytechnique de Montréal, C.P. 6079, Succ. A, Montréal

来源：

ULTRAMICROSCOPY | 1992年 / 41卷 / 04期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0304-3991(92)90208-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The effect of accelerating voltage and thickness on the signal-to-noise ratio was investigated. By measuring an effective signal-to-noise ratio, which allows appropriate comparison of data acquired at different incident energies, it is shown that improvements in the sensitivity at higher voltages depend on the angular scattering distribution of the edges of interest relative to the spectrometer collection conditions. The measurements also show that the effective sensitivity is reduced as a function of thickness.

引用

页码：287 / 290

页数：4

共 11 条

[1]

Burbery A. J., 1986, JEOL News, Electron Optics Instrumentation, V24E, P2

[2]

DISKO MM, 1986, INTERMEDIATE VOLTAGE, P72

[3]

EGERTON RF, 1986, INTERMEDIATE VOLTAGE, P67

[4]

ISAACSON M, 1975, ULTRAMICROSCOPY, V1, P32

[5] EELS LOG-RATIO TECHNIQUE FOR SPECIMEN-THICKNESS MEASUREMENT IN THE TEM [J].

MALIS, T ;

CHENG, SC ;

EGERTON, RF .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1988, 8 (02) :193-200

[6]

SEVELY J, 1987, SCANNING MICROSCOP S, V1, P179

[7] UNBIASED METHOD FOR SIGNAL ESTIMATION IN ELECTRON-ENERGY LOSS SPECTROSCOPY, CONCENTRATION MEASUREMENTS AND DETECTION LIMITS IN QUANTITATIVE MICROANALYSIS - METHODS AND PROGRAMS [J].

TREBBIA, P .

ULTRAMICROSCOPY, 1988, 24 (04) :399-408

[8]

UNSER M, 1987, J MICROSC-OXFORD, V145, P245

[9]

[No title captured]

[10]

[No title captured]

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