EELS LOG-RATIO TECHNIQUE FOR SPECIMEN-THICKNESS MEASUREMENT IN THE TEM

被引：717

作者：

MALIS, T

CHENG, SC

EGERTON, RF

机构：

[1] UNIV ALBERTA,DEPT PHYS,EDMONTON T6G 2J1,ALBERTA,CANADA

[2] SUNY STONY BROOK,DEPT MAT SCI,STONY BROOK,NY 11794

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1988年 / 8卷 / 02期

关键词：

D O I：

10.1002/jemt.1060080206

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：193 / 200

页数：8

共 15 条

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