MEASUREMENT OF LOCAL THICKNESS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：132

作者：

EGERTON, RF

CHENG, SC

机构：

[1] Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can

来源：

ULTRAMICROSCOPY | 1987年 / 21卷 / 03期

关键词：

We thank Dr. P.A. Crozier and Dr. S.S. Sheinin for a number of interesting and useful discussions. and the Natural Sciences and Engineering Research Council of Canada for supporting analytical electron microscopy at the University of Alberta;

D O I：

10.1016/0304-3991(87)90148-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：231 / 244

页数：14

共 36 条

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