MEASUREMENT OF LOCAL THICKNESS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：132

作者：

EGERTON, RF

CHENG, SC

机构：

[1] Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can

来源：

ULTRAMICROSCOPY | 1987年 / 21卷 / 03期

关键词：

We thank Dr. P.A. Crozier and Dr. S.S. Sheinin for a number of interesting and useful discussions. and the Natural Sciences and Engineering Research Council of Canada for supporting analytical electron microscopy at the University of Alberta;

D O I：

10.1016/0304-3991(87)90148-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：231 / 244

页数：14

共 36 条

[31] SCHEINFEIN M, 1984, SCAN ELECTRON MICROS, P1681
[32] TREBBIA P, 1979, THESIS U PARIS
[33] NEW QUANTITATIVE METHOD FOR ANALYSIS OF ENERGY-LOSS SPECTRA OBTAINED WITH FAST ELECTRONS SCATTERED IN FORWARD DIRECTION - APPLICATION TO STUDY OF NOBLE-METALS
WEHENKEL, C
[J]. JOURNAL DE PHYSIQUE, 1975, 36 (02): : 199 - 213
[34] MEASUREMENT OF METALLIC FILM DENSITIES BY AN OPTICAL TECHNIQUE
WOLTER, AR
[J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (08) : 2377 - &
[35] [No title captured]
[36] [No title captured]

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