ELECTRON-EMISSION FROM AN INDIVIDUAL, SUPPORTED C-60 MOLECULE

被引:15
作者
LIN, ME
ANDRES, RP
REIFENBERGER, R
HUFFMAN, DR
机构
[1] PURDUE UNIV, SCH CHEM ENGN, W LAFAYETTE, IN 47907 USA
[2] UNIV ARIZONA, DEPT PHYS, TUCSON, AZ 85721 USA
关键词
D O I
10.1103/PhysRevB.47.7546
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electron emission properties of a single C60 molecule supported on a W field-emission tip are reported. Using standard models, values for the size, effective work function, and desorption temperature of C60 were obtained. Energy distributions of electrons emitted from C60 exhibit a narrow two-peaked spectrum and indicate a splitting of the highest occupied molecular-orbital level.
引用
收藏
页码:7546 / 7553
页数:8
相关论文
共 46 条
  • [1] DIRECT IMAGING OF 13-A-DIAM AU CLUSTERS USING SCANNING TUNNELING MICROSCOPY
    BARO, AM
    BARTOLOME, A
    VAZQUEZ, L
    GARCIA, N
    REIFENBERGER, R
    CHOI, E
    ANDRES, RP
    [J]. APPLIED PHYSICS LETTERS, 1987, 51 (20) : 1594 - 1596
  • [2] THE VIBRATIONAL RAMAN-SPECTRA OF PURIFIED SOLID FILMS OF C-60 AND C-70
    BETHUNE, DS
    MEIJER, G
    TANG, WC
    ROSEN, HJ
    [J]. CHEMICAL PHYSICS LETTERS, 1990, 174 (3-4) : 219 - 222
  • [3] CHARACTERIZATION OF MICROTIPS FOR SCANNING TUNNELING MICROSCOPY
    BINH, VT
    MARIEN, J
    [J]. SURFACE SCIENCE, 1988, 202 (1-2) : L539 - L549
  • [4] INSITU FABRICATION AND REGENERATION OF MICROTIPS FOR SCANNING TUNNELLING MICROSCOPY
    BINH, VT
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 355 - 361
  • [5] SIZE-DEPENDENT MELTING TEMPERATURE OF INDIVIDUAL NANOMETER-SIZED METALLIC CLUSTERS
    CASTRO, T
    REIFENBERGER, R
    CHOI, E
    ANDRES, RP
    [J]. PHYSICAL REVIEW B, 1990, 42 (13) : 8548 - 8556
  • [6] A FIELD-EMISSION TECHNIQUE TO MEASURE THE MELTING TEMPERATURE OF INDIVIDUAL NANOMETER-SIZED CLUSTERS
    CASTRO, T
    REIFENBERGER, R
    CHOI, E
    ANDRES, RP
    [J]. SURFACE SCIENCE, 1990, 234 (1-2) : 43 - 52
  • [7] STUDIES OF INDIVIDUAL NANOMETER-SIZED METALLIC CLUSTERS USING SCANNING TUNNELING MICROSCOPY, FIELD-EMISSION, AND FIELD-ION MICROSCOPY
    CASTRO, T
    LI, YZ
    REIFENBERGER, R
    CHOI, E
    PARK, SB
    ANDRES, RP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2845 - 2849
  • [8] CASTRO T, 1991, MATER RES SOC SYMP P, V206, P159
  • [9] CASTRO TK, 1989, THESIS PURDUE U
  • [10] CHEN T, 1991, MATER RES SOC SYMP P, V206, P721