QUANTITATIVE TENSILE-TILTING STAGES FOR HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：39

作者：

MESSERSCHMIDT, U ^{[1
]}

APPEL, F ^{[1
]}

机构：

[1] AKAD WISSENSCH DDR,INST FESTKORPERPHYS & ELEKTRONENMIKROSKOPIE,DDR-401 HALLE,GER DEM REP

来源：

关键词：

Compendex;

D O I：

10.1016/0304-3991(76)90036-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

MICROSCOPES, ELECTRON

引用

页码：223 / 230

页数：8

共 12 条

[1] ANDREN HO, 1972, 5 P EUR C EL MICR MA, P324
[2] BAUER RW, 1972, ELECTRON MICROS, P85
[3] HYDRAULIC-TYPE TENSILE DEVICE FOR TRANSMISSION ELECTRON-MICROSCOPY
NOHARA, A
IMURA, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (07) : 1039 - &
[4] NOHARA A, 1974, 8TH P INT C EL MICR, P570
[5] MEASUREMNET OF STRESS AND STRAIN ON SPECIMENS IN AN ELECTRON MICROSCOPE
SAKA, H
IMURA, T
YUKAWA, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (01) : 1 - &
[6] VALDRE U, 1970, 7TH P INT C EL MIC 1, P131
[7] VALLE R, 1974, 8TH P INT C EL MICR, P180
[8] 1974, 3RD P INT C HIGH VOL
[9] 1975, 4TH P INT C HIGH VOL
[10] 1970, 7TH P INT C EL MIC 1