MEASUREMNET OF STRESS AND STRAIN ON SPECIMENS IN AN ELECTRON MICROSCOPE

被引：14

作者：

SAKA, H

IMURA, T

YUKAWA, N

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1971年 / 10卷 / 01期

关键词：

D O I：

10.1143/JJAP.10.1

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1 / &

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[9] STRESS MEASURABLE TENSILE DEVICE FOR ELECTRON MICROSCOPIC OBSERVATION
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