ACOUSTIC MICROSCOPY OF LOW-DUCTILITY MATERIALS

被引：12

作者：

FATKIN, DGP ^{[1
]}

SCRUBY, CB ^{[1
]}

BRIGGS, GAD ^{[1
]}

机构：

[1] HARWELL LAB,DIV MAT PHYS & MET,DIDCOT OX11 0RA,OXON,ENGLAND

来源：

关键词：

D O I：

10.1007/BF00660928

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：23 / 40

页数：18

共 19 条

[1] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY
ATALAR, A
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139
[2] Bertoni H. L., 1984, IEEE Transactions on Sonics and Ultrasonics, VSU-31, P105, DOI 10.1109/T-SU.1984.31483
[3] BRIGGS GAD, 1985, ROYAL MICROSCOPICAL, V12
[4] DATTA SK, 1986, REV PROGR QUANTITATI, V7
[5] ULTRASONIC ABSORPTION MICROSCOPE
DUNN, F
FRY, WJ
[J]. JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1959, 31 (05) : 632 - 633
[6] ADVANCES IN SUPERFLUID-HELIUM ACOUSTIC MICROSCOPY
HADIMIOGLU, B
FOSTER, JS
[J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (07) : 1976 - 1980
[7] HOPPE M, 1985, IEEE T SON ULTRASON, V32, P289, DOI 10.1109/T-SU.1985.31595
[8] HOPPE M, 1986, REV SCI INSTRUM, V57, P2568
[9] ACOUSTIC MICROSCOPY AT OPTICAL WAVELENGTHS
JIPSON, V
QUATE, CF
[J]. APPLIED PHYSICS LETTERS, 1978, 32 (12) : 789 - 791
[10] MATERIAL CHARACTERIZATION BY LINE-FOCUS-BEAM ACOUSTIC MICROSCOPE
KUSHIBIKI, J
CHUBACHI, N
[J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1985, 32 (02): : 189 - 212