MATERIAL CHARACTERIZATION BY LINE-FOCUS-BEAM ACOUSTIC MICROSCOPE

[1] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[2] PHYSICAL MODEL FOR ACOUSTIC SIGNATURES [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8237 - 8239

[3] ATTAL J, 1980, SCANNED IMAGE MICROS, P97

[4] AULD BA, 1976, ACOUSTIC FIELDS WAVE, P96

[5] ELASTIC AND PIEZOELECTRIC CONSTANTS OF ALPHA-QUARTZ [J]. PHYSICAL REVIEW, 1958, 110 (05): : 1060 - 1061

[6] Bertoni H. L., 1973, Applied Physics, V2, P157, DOI 10.1007/BF00884205

[7] FILM ADHESION STUDIES WITH THE ACOUSTIC MICROSCOPE [J]. THIN SOLID FILMS, 1980, 74 (02) : 295 - 302

[8] PROPAGATION OF SURFACE WAVES AT BOUNDARY BETWEEN A PIEZOELECTRIC CRYSTAL AND A FLUID MEDIUM [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1970, SU17 (02): : 71 - +

[9] CONWELL EM, 1952, P IRE, V50, P1327

[10] SPEED OF SOUND IN WATER BY A DIRECT METHOD [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1957, 59 (04): : 249 - 254

[1] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[2] PHYSICAL MODEL FOR ACOUSTIC SIGNATURES [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8237 - 8239

[3] ATTAL J, 1980, SCANNED IMAGE MICROS, P97

[4] AULD BA, 1976, ACOUSTIC FIELDS WAVE, P96

[5] ELASTIC AND PIEZOELECTRIC CONSTANTS OF ALPHA-QUARTZ [J]. PHYSICAL REVIEW, 1958, 110 (05): : 1060 - 1061

[6] Bertoni H. L., 1973, Applied Physics, V2, P157, DOI 10.1007/BF00884205

[7] FILM ADHESION STUDIES WITH THE ACOUSTIC MICROSCOPE [J]. THIN SOLID FILMS, 1980, 74 (02) : 295 - 302

[8] PROPAGATION OF SURFACE WAVES AT BOUNDARY BETWEEN A PIEZOELECTRIC CRYSTAL AND A FLUID MEDIUM [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1970, SU17 (02): : 71 - +

[9] CONWELL EM, 1952, P IRE, V50, P1327

[10] SPEED OF SOUND IN WATER BY A DIRECT METHOD [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1957, 59 (04): : 249 - 254