FILM ADHESION STUDIES WITH THE ACOUSTIC MICROSCOPE

[1] Ahn J., 1978, Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings, P134, DOI 10.1520/STP38630S

[2] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[3] ATALAR A, 1978, THESIS STANFORD U, P143

[4] Brekhovskikh L.M., 1969, WAVES LAYERED MEDIA

[5] Campbell DS, 1970, HDB THIN FILM TECHNO

[6] ACOUSTIC MICROSCOPY AT OPTICAL WAVELENGTHS [J]. APPLIED PHYSICS LETTERS, 1978, 32 (12) : 789 - 791

[7] LEMONS RA, 1975, THESIS STANFORD U, P223

[8] LEMONS RA, 1979, PHYSICAL ACOUSTICS, V14

[9] Mittal K. L., 1978, ADHESION MEASUREMENT

[10] ADHESION MEASUREMENT OF THIN-FILMS [J]. ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (01): : 21 - 42

[1] Ahn J., 1978, Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings, P134, DOI 10.1520/STP38630S

[2] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[3] ATALAR A, 1978, THESIS STANFORD U, P143

[4] Brekhovskikh L.M., 1969, WAVES LAYERED MEDIA

[5] Campbell DS, 1970, HDB THIN FILM TECHNO

[6] ACOUSTIC MICROSCOPY AT OPTICAL WAVELENGTHS [J]. APPLIED PHYSICS LETTERS, 1978, 32 (12) : 789 - 791

[7] LEMONS RA, 1975, THESIS STANFORD U, P223

[8] LEMONS RA, 1979, PHYSICAL ACOUSTICS, V14

[9] Mittal K. L., 1978, ADHESION MEASUREMENT

[10] ADHESION MEASUREMENT OF THIN-FILMS [J]. ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (01): : 21 - 42