学术探索
学术期刊
新闻热点
数据分析
智能评审

AVAILABILITY ANALYSIS OF A 2-UNIT COLD STANDBY SYSTEM WITH 2 SWITCHING FAILURE MODES

被引：7
作者：
GOEL, LR
GUPTA, R
机构：
来源：
MICROELECTRONICS RELIABILITY | 1984年 / 24卷 / 03期
关键词：
D O I：
10.1016/0026-2714(84)90467-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：419 / 423
页数：5
相关论文
共 5 条
[1]   CONCEPT OF COVERAGE AND ITS EFFECT ON RELIABILITY MODEL OF A REPAIRABLE SYSTEM [J].
ARNOLD, TF .
IEEE TRANSACTIONS ON COMPUTERS, 1973, C 22 (03) :251-254
[2]   RELIABILITY OF SOME MODULARLY REDUNDANT SYSTEMS [J].
CHOW, DK .
IEEE TRANSACTIONS ON RELIABILITY, 1972, R 21 (02) :67-+
[3]   RELIABILITY-ANALYSIS OF A 2-UNIT COLD STANDBY REDUNDANT SYSTEM WITH 2 OPERATING MODES [J].
GUPTA, SM ;
JAISWAL, NK ;
GOEL, LR .
MICROELECTRONICS AND RELIABILITY, 1982, 22 (04) :747-758
[4]   SWITCH FAILURE IN A 2-UNIT STANDBY REDUNDANT SYSTEM [J].
GUPTA, SM ;
JAISWAL, NK ;
GOEL, LR .
MICROELECTRONICS AND RELIABILITY, 1983, 23 (01) :129-132
[5]  
PROCTOR CL, 1975, MICROELECTRON RELIAB, V14, P403
1