INFLUENCE OF DETECTOR GEOMETRY ON IMAGE PROPERTIES OF STEM FOR THICK OBJECTS

被引：35

作者：

ROSE, H

FERTIG, J

机构：

[1] NEW YORK STATE DEPT HLTH,DIV LABS & RES,ALBANY,NY 12201

[2] TH DARMSTADT,INST THEORET PHYS,D-6100 DARMSTADT,FED REP GER

来源：

关键词：

D O I：

10.1016/S0304-3991(76)90518-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：77 / 87

页数：11

共 13 条

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GILDE, H ;

REIMER, L .

JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (JAN) :81-92

[4]

Glauber R.I., 1959, LECTURES THEORETICAL, V1, P315

[5] THICK SPECIMENS IN CEM AND STEM - RESOLUTION AND IMAGE-FORMATION [J].

GROVES, T .

[6]

Groves T., 1975, Scanning Electron Microscopy 1975, P79

[7]

HASSELBACH G, 1975, Z PHYSIK B, V22, P151

[8]

LENZ F, 1954, Z NATURFORSCH A, V9, P185

[9]

ROSE A, 1948, ADV ELECTRON, V1, P79

[10]

ROSE H, 1974, OPTIK, V39, P416