X-RAY-ANALYSIS OF INTERNAL-STRESSES IN CRYSTALS .1. GENERAL EQUATIONS

被引：16

作者：

INDENBOM, VL

KAGANER, VM

机构：

[1] Institute of Crystallography, Academy of Sciences of the Ussr

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1990年 / 118卷 / 01期

关键词：

D O I：

10.1002/pssa.2211180109

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

General equations are derived describing crystal lattice distortions determined by X‐ray measurements of the local spacing and orientation variations of reflecting crystal planes. It is shown that the tensor of crystal lattice distortions corresponds to the sum of elastic distortions due to dislocations and total distortions due to nondislocation sources (impurities, nonuniform temperature distribution, etc.). The measured distribution of crystal lattice distortions provides the simultaneous determinations of the dislocation density tensor and the nonuniform distribution of nondislocation sources (e.g., impurity concentration gradient). Copyright © 1990 WILEY‐VCH Verlag GmbH & Co. KGaA

引用

页码：71 / 84

页数：14

共 19 条

[1]

Barnett S. J., 1987, I PHYS C SER, V87, P615

[2] X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS [J].