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RADIATION HARDENED 64-BIT CMOS-SOS RAM
被引:6
作者
:
KJAR, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,ANAHEIM,CA 92803
ROCKWELL INT,ANAHEIM,CA 92803
KJAR, RA
[
1
]
PETERSON, BE
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,ANAHEIM,CA 92803
ROCKWELL INT,ANAHEIM,CA 92803
PETERSON, BE
[
1
]
BLANDFORD, JT
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT,ANAHEIM,CA 92803
ROCKWELL INT,ANAHEIM,CA 92803
BLANDFORD, JT
[
1
]
机构
:
[1]
ROCKWELL INT,ANAHEIM,CA 92803
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1976年
/ 23卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1976.4328569
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1728 / 1731
页数:4
相关论文
共 3 条
[1]
KJAR RA, 1976, IEEE T NS, V23
[2]
INVESTIGATION OF RADIATION EFFECTS AND HARDENING PROCEDURES FOR CMOS-SOS
[J].
PEEL, JL
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PEEL, JL
;
PANCHOLY, RK
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PANCHOLY, RK
;
KUHLMANN, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
KUHLMANN, GJ
;
OKI, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
OKI, TJ
;
WILLIAMS, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
WILLIAMS, RA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
:2185
-2189
[3]
CMOS-SOS NAND GATE SAPPHIRE PHOTOCURRENT COMPENSATION
[J].
PHILLIPS, DH
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PHILLIPS, DH
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
:2617
-2620
←
1
→
共 3 条
[1]
KJAR RA, 1976, IEEE T NS, V23
[2]
INVESTIGATION OF RADIATION EFFECTS AND HARDENING PROCEDURES FOR CMOS-SOS
[J].
PEEL, JL
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PEEL, JL
;
PANCHOLY, RK
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PANCHOLY, RK
;
KUHLMANN, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
KUHLMANN, GJ
;
OKI, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
OKI, TJ
;
WILLIAMS, RA
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
WILLIAMS, RA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
:2185
-2189
[3]
CMOS-SOS NAND GATE SAPPHIRE PHOTOCURRENT COMPENSATION
[J].
PHILLIPS, DH
论文数:
0
引用数:
0
h-index:
0
机构:
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
ROCKWELL INT CORP,ELECTR RES DIV,3370 MIRALOMA AVE,ANAHEIM,CA 92803
PHILLIPS, DH
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
:2617
-2620
←
1
→