OBSERVATION OF THE MELTING SOLIDIFICATION PROCESSES OF AN AL CRYSTAL BY SYNCHROTRON X-RAY TOPOGRAPHY

被引：24

作者：

GRANGE, G

JOURDAN, C

COULET, AL

GASTALDI, J

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1985年 / 72卷 / 03期

关键词：

D O I：

10.1016/0022-0248(85)90233-7

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：748 / 752

页数：5

共 8 条

[1]

CHIKAWA J, 1974, J CRYST GROWTH, V24, P61, DOI 10.1016/0022-0248(74)90281-4

[2] MELTING OF SILICON-CRYSTALS AND A POSSIBLE ORIGIN OF SWIRL DEFECTS [J].

CHIKAWA, J ;

SHIRAI, S .

JOURNAL OF CRYSTAL GROWTH, 1977, 39 (02) :328-340

[3]

CHIKAWA J, 1979, JAPAN J APPL PHY S18, V18, P153

[4]

CHIKAWA JI, 1981, INDIAN J PURE AP PHY, V19, P890

[5] OBSERVATION BY SYNCHROTRON X-RAY TOPOGRAPHY OF FACETING EVOLUTION OF GRAIN-BOUNDARIES DURING RECRYSTALLIZATION [J].

GASTALDI, J ;

JOURDAN, C .

JOURNAL OF CRYSTAL GROWTH, 1981, 52 (APR) :949-955

[6] ULTRAHIGH-VACUUM HEATING CAMERA FOR INSITU SYNCHROTRON RADIATION X-RAY TOPOGRAPHIC STUDIES [J].

GASTALDI, J ;

JOURDAN, C ;

MARZO, P ;

ALLASIA, C ;

JULLIEN, JN .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (AUG) :391-395

[7]

KOBAYASHI T, 1984, JPN J APPL PHYS 2, V23, pL632, DOI 10.1143/JJAP.23.L632

[8] INSITU OBSERVATION ON MELT GROWTH-PROCESS OF TIN CRYSTAL BY MEANS OF SYNCHROTRON X-RAY TOPOGRAPHY [J].

NITTONO, O ;

OGAWA, T ;

GONG, SK ;

NAGAKURA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (08) :L581-L583

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